Students acquire knowledge in the field of system reliability, error modeling in digital systems, digital system testing, automatic test pattern generation (ATPG), design for test (DFT), built-in self test (BIST), digital system design techniques with error tolerance.

Students who complete the course have the ability to: -model and simulate errors in digital systems, -generate pattern tests for digital system testing, -design for test systems, -design error tolerant systems

System reliability, models of reliability, the terminology and modeling of errors in digital systems, the ‘’stuck-at’’ error model, digital system testing for error detection, error simulation in digital systems, the off-line and on-line testing concept, the automatic test pattern generation (ATPG), the design-for-test (DFT), the built-in self test (BIST), error detection and correction codes, algorithm-based fault tolerance, error tolerance, hardware, informational, temporal, software redundancy, the design of digital systems with self-testing options, design of fault tolerant systems for digital signal processing, advanced techniques in fault tolerant system design, fault tolerant reconfigurable systems, cellular automata systems, embrionics systems.

Lectures. Auditory practice. Computer practice. Laboratory practice. Tutorial work